| Measurement of inner surface roughness of capillary by an x-ray reflectivity method |
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| 作者姓名： | 李玉德 林晓燕 谭植元 孙天希 刘志国 |
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| 作者单位： | The Key Laboratory of Beam Technology and Material Modification of Ministry of Education,College of Nuclear Science and Technology,Beijing Normal University,Beijing Radiation Center |
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| 基金项目： | Project supported by the Natural Science Foundation of Beijing, China (Grant No. 1102019) and the Specialized Research Fund for the Doctoral Program of Higher Education of China (Grant No. 20100003120010). |
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| 摘 要： | The inner surface roughness of a capillary is investigated by the reflectivity of x-rays penetrating through the capillary. The results are consistent with the data from atomic force microscope (AFM). The roughness measured by this new method can reach the order of angstroms with high quality capillaries.
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| 关 键 词： | inner surface roughness reflectivity method capillary |
| 收稿时间： | 2010-12-31 |
| 修稿时间： | 1/4/2011 12:00:00 AM |
Measurement of inner surface roughness of capillary by an x-ray reflectivity method |
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| Li Yu-De,Lin Xiao-Yan,Tan Zhi-Yuan,Sun Tian-Xi and Liu Zhi-Guo.Measurement of inner surface roughness of capillary by an x-ray reflectivity method[J].Chinese Physics B,2011,20(4):40702-040702. |
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| Authors: | Li Yu-De Lin Xiao-Yan Tan Zhi-Yuan Sun Tian-Xi and Liu Zhi-Guo |
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| Affiliation: | The Key Laboratory of Beam Technology and Material Modification of Ministry of Education, College of Nuclear Science and Technology, Beijing Normal University, Beijing Radiation Center, Beijing 100875, China;The Key Laboratory of Beam Technology and Material Modification of Ministry of Education, College of Nuclear Science and Technology, Beijing Normal University, Beijing Radiation Center, Beijing 100875, China;The Key Laboratory of Beam Technology and Material Modification of Ministry of Education, College of Nuclear Science and Technology, Beijing Normal University, Beijing Radiation Center, Beijing 100875, China;The Key Laboratory of Beam Technology and Material Modification of Ministry of Education, College of Nuclear Science and Technology, Beijing Normal University, Beijing Radiation Center, Beijing 100875, China;The Key Laboratory of Beam Technology and Material Modification of Ministry of Education, College of Nuclear Science and Technology, Beijing Normal University, Beijing Radiation Center, Beijing 100875, China |
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| Abstract: | The inner surface roughness of a capillary is investigated by the reflectivity of x-rays penetrating through the capillary. The results are consistent with the data from atomic force microscope (AFM). The roughness measured by this new method can reach the order of angstroms with high quality capillaries. |
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| Keywords: | inner surface roughness reflectivity method capillary |
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