| Analysis of secondary electron emission using the fractal method |
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| 作者姓名： | 白春江 胡天存 何鋆 苗光辉 王瑞 张娜 崔万照 |
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| 作者单位： | National Key Laboratory of Science and Technology on Space Science |
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| 基金项目： | Project supported by the National Natural Science Foundation of China(Grant Nos.U1537211 and 61901361)。 |
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| 摘 要： | Based on the rough surface topography with fractal parameters and the Monte–Carlo simulation method for secondary electron emission properties, we analyze the secondary electron yield(SEY) of a metal with rough surface topography. The results show that when the characteristic length scale of the surface, G, is larger than 1 × 10-7, the surface roughness increases with the increasing fractal dimension D. When the surface roughness becomes larger, it is difficult for entered electrons to escape surface. As a result, more electrons are collected and then SEY decreases. When G is less than 1 × 10-7,the effect of the surface topography can be ignored, and the SEY almost has no change as the dimension D increases. Then,the multipactor thresholds of a C-band rectangular impedance transfer and an ultrahigh-frequency-band coaxial impedance transfer are predicted by the relationship between the SEY and the fractal parameters. It is verified that for practical microwave devices, the larger the parameter G is, the higher the multipactor threshold is. Also, the larger the value of D,the higher the multipactor threshold.
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| 关 键 词： | secondary electron emission yield the fractal method MULTIPACTOR |
Analysis of secondary electron emission using the fractal method |
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| Chun-Jiang Bai,Tian-Cun Hu,Yun He,Guang-Hui Miao,Rui Wang,Na Zhang,Wan-Zhao Cui.Analysis of secondary electron emission using the fractal method[J].Chinese Physics B,2021(1). |
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| Authors: | Chun-Jiang Bai Tian-Cun Hu Yun He Guang-Hui Miao Rui Wang Na Zhang Wan-Zhao Cui |
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| Affiliation: | (National Key Laboratory of Science and Technology on Space Science,China Academy of Space Technology(Xi’an),Xi’an 710100,China) |
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