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A digital CDS technique and its performance testing
作者姓名:刘晓艳  陆景彬  杨彦佶  陆波  王于仨  徐玉朋  崔苇苇  李炜  李茂顺  王娟  韩大炜  陈田祥  霍嘉  胡渭  张艺  朱玥  张子良  尹国和  王宇  赵仲毅  付艳红  张娅  马克岩  陈勇
作者单位:1 College of Physics, Jilin University, No.2699, Qianjin Road, Changchun 130023, China;;2 Key Laboratory of Particle Astrophysics, Institute of High Energy Physics, Chinese Academy of Sciences, 19B Yuquan Road, Beijing 100049, China;;3 School of Physical Science and Technology, Yunnan University, Cuihu North Road 2, Kunming 650091, China
摘    要:Readout noise is a critical parameter for characterizing the performance of charge-coupled devices (CCDs), which can be greatly reduced by the correlated double sampling (CDS) circuit. However, a conventional CDS circuit inevitably introduces new noise since it consists of several active analog components such as operational amplifiers. This paper proposes a digital CDS circuit technique, which transforms the pre-amplified CCD signal into a train of digital presentations by a high-speed data acquisition card directly without the noisy CDS circuit, then implements the digital CDS algorithm through a numerical method. A readout noise of 3.3 e- and an energy resolution of 121 eV@5.9 keV can be achieved via the digital CDS technique.

关 键 词:charge-coupled  devices  readout  noise  correlated  double  sampling
收稿时间:2014-10-10
修稿时间:2014-11-21
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