An optimal burn‐in policy based on a degradation model |
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| Authors: | E Mosayebi Omshi S Shemehsavar |
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| Affiliation: | School of Mathematics, Statistics and Computer Sciences, University of Tehran, Tehran, Iran |
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| Abstract: | Burn‐in tests help manufacturers detect defective items and remove them before being sold to customers. In a competitive marketplace, cost is a major consideration and not employing a burn‐in test may result in higher and needless expenses. With this in mind, we consider degradation‐based burn‐in tests in which the degradation path follows a Wiener process and weak items are identified when the process crosses a piecewise linear function. We also study linear functions as a special case of such a piecewise linear barrier. Within this setup, we apply a cost model to determine the optimal burn‐in test. Finally, we discuss an illustrative example using GaAs laser degradation data and present an optimal burn‐in test for it. |
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| Keywords: | degradation model mixture distribution optimal burn‐in test Wiener process |
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