X‐ray analyzer‐based phase‐contrast computed laminography |
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| Authors: | Keiichi Hirano Yumiko Takahashi Kazuyuki Hyodo Masao Kimura |
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| Affiliation: | Institute of Materials Structure Science, High Energy Accelerator Research Organization, 1-1, Oho, Tsukuba, Ibaraki305-0801, Japan |
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| Abstract: | X‐ray analyzer‐based phase‐contrast imaging is combined with computed laminography for imaging regions of interest in laterally extended flat specimens of weak absorption contrast. The optics discussed here consist of an asymmetrically cut collimator crystal and a symmetrically cut analyzer crystal arranged in a nondispersive (+, ?) diffraction geometry. A generalized algorithm is given for calculating multi‐contrast (absorption, refraction and phase contrast) images of a sample. Basic formulae are also presented for laminographic reconstruction. The feasibility of the method discussed was verified at the vertical wiggler beamline BL‐14B of the Photon Factory. At a wavelength of 0.0733 nm, phase‐contrast sectional images of plastic beads were successfully obtained. Owing to strong circular artifacts caused by a sample holder, the field of view was limited to about 6 mm in diameter. |
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| Keywords: | X‐ray phase‐contrast imaging computed laminography image processing |
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