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Simulation and experimental study of high power microwave damage effect on AlGaAs/InGaAs pseudomorphic high electron mobility transistor |
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| Authors: | Yu Xin-Hai;Chai Chang-Chun;Liu Yang;Yang Yin-Tang;Xi Xiao-Wen |
| Affiliation: | Yu Xin-Hai;Chai Chang-Chun;Liu Yang;Yang Yin-Tang;Xi Xiao-Wen;Key Laboratory of Ministry of Education for Wide Band-Gap Semiconductor Materials and Devices, School of Microelectronics,Xidian University; |
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