| Abstract: | This paper reports that bunchy flake-like nano-graphite crystallite
films (BNGCFs) were deposited on Si substrates by using the microwave
chemical vapour deposition technique. Furthermore the BNGCFs were
characterized by x-ray diffraction spectra, scanning electron
microscopy, Raman spectra and field emission (FE) $I$--$V$
measurements, and a lowest turn-on field of 1.5\,V/$\mu $m, and a high
average emission current density of 30\,mA/cm$^{2}$ at a macroscopic
electric field of 8.0\,V/$\mu $m were obtained. The $J$--$E$ data
did not follow the original Fowler--Nordheim (F--N) relation since
they were not well represented in the F--N plot by a straight line.
A model considering the F--N mechanism, and the statistic effects of FE tip
structures has been applied successfully to explain all the FE data
observed for $E<8.8$\,V/$\mu $m. |
