Synergistic effects of neutron and gamma ray irradiation of a commercial CHMOS microcontroller |
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| Authors: | Jin Xiao-Ming Fan Ru-Yu Chen Wei Lin Dong-Sheng Yang shan-Chao Bai Xiao-Yan Liu Yan Guo Xiao-Qiang and Wang Gui-Zhen |
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| Affiliation: | [1]Department of Engineering Physics, Tsinghua University, Beijing 100084, China [2]Northwest Institute of Nuclear Technology, Xi＇an 710024, China |
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| Abstract: | This paper presents the experimental results of a combined irradiation environment of neutron and gamma rays on 80C196KC20,which is a 16-bit high performance member of the MCS96 microcontroller family.The electrical and functional tests were made in three irradiation environments:neutron,gamma rays,combined irradiation of neutron and gamma rays.The experimental results show that the neutron irradiation can affect the total ionizing dose behaviour.Compared with the single radiation environment,the microcontroller exhibits considerably more severe degradation in neutron and gamma ray synergistic irradiation.This phenomenon may cause a significant hardness assurance problem. |
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