PRECISE MEASUREMENT OF DENSITY-DEPENDENT SHIFT BY WAVELENGTH MODULATION REFLECTION SPECTROSCOPY |
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| Authors: | Xiao Lian-tuan Zhao Jian-ming Li Chang-yong Jia Suo-tang and Zhou Guo-sheng |
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| Affiliation: | Department of Electronics and Information Technology, Shanxi University Taiyuan 030006 and Key Laboratory of Quantum Optics, Ministry of Education, China |
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| Abstract: | The density dependence of the line shift of the cesium D2 line is studied with sub-Doppler selective reflection spectroscopy. By use of wavelength modulation and sixth-harmonics detection we observed the coefficient of the pressure-induced shift of the 6S1/2(F=4)→6P3/2(F'=3) hyperfine transition of the cesium D2 line Δδ/ρ=-0.9(5)×10-8cm3. In the limit ρ=0 a frequency shift about -3MHz remains, which may be attributed to long-range atom－surface interactions. The experimental results can be used in measurements of the local field-induced frequency shift at high atomic densities with sufficient accuracy. |
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| Keywords: | selective reflection sub-Doppler wavelength modulation spectroscopy harmonic detection |
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