Z-scan analysis of high-order nonlinear refraction effect induced by using elliptic Gaussian beam |
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| Authors: | Guo Shi-Fang and Tian Qiang |
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| Affiliation: | Department of Physics, Beijing Normal University, Beijing 100875, China |
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| Abstract: | The irradiance of an elliptic Gaussian beam that is high
enough to excite high-order nonlinear refraction effect is used to
calculate the normalized on-axis transmittance function in the z-scan
technique by introducing complex beam parameters which make the
calculation simpler. The transmittance formula is applied to the
first-, first two-, and first three-order nonlinearities. Numerical
evaluation shows that the symmetry no longer holds when using an
elliptic Gaussian beam instead of a circular Gaussian beam. A
distortion is observed in the central part of the curve, which
decreases as ellipticity increases. Moreover, the variation of the
normalized peak-valley difference decreases as ellipticity
decreases. |
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| Keywords: | z-scan elliptic Gaussian beam complex beam parameter high order |
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