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Improved power simulation of AlGaN/GaN HEMT at class-AB operation via an RF drain–source current correction method
Authors:Pongthavornkamol Tiwat  Pang Lei  Yuan Ting-Ting  Liu Xin-Yu
Affiliation:Key Laboratory of Microelectronics Devices & Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China
Abstract:AlGaN/GaN HEMT RF drain–source current RF dispersion effect power-added efficiency
Keywords:AlGaN/GaN HEMT  RF drain–source current  RF dispersion effect  power-added efficiency
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