BROADENING OF RESISTIVE TRANSITION AND IRREVERSIBILITY LINE FOR EPITAXIAL YBa2Cu3O7-$\delta$ THIN FILM |
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| Affiliation: | Institute of Plasma Physics, Academia Sinica, Hefei 230031, China; Institute of Solid State Physics, Academia Sinica, Hefei 230031, China |
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| Abstract: | The broadening of resistive transition of c axis oriented epitaxial YBCO thin film has been measured for three configurations: (1) H∥c and H⊥I; (2) H∥ab plane and H⊥I; (3) H∥ab plane and H∥I in magnetic field up to 8 Teala(T), and for different angle $\theta$ of magnetic field relative to the ab plane with H = 4T. The results obtained indicate that the broadening of resistive transition is mainly determined by the angle $\theta$, but is hardly related to the angle $\alpha$ made between magnetic field and tran sport current in ab plane. This means that the broadening of resistive transition is not determined by flux motion drived by apparent Lorentz force. Au expression of angular dependence of irreveraibility line has been given. |
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