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| X射线掠入射显微成像诊断技术研究进展 | |
| 引用本文： | 徐捷, 穆宝忠, 陈亮, 等. X射线掠入射显微成像诊断技术研究进展[J]. 强激光与粒子束, 2020, 32: 112001. doi: 10.11884/HPLPB202032.200133 |
| 作者姓名： | 徐捷 穆宝忠 陈亮 李文杰 徐欣业 王新 王占山 张兴 丁永坤 |
| 作者单位： | 1.同济大学 教育部先进微结构材料重点实验室，上海 200092;;2.同济大学 物理科学与工程学院，上海 200092;;3.中国工程物理研究院 激光聚变研究中心，四川 绵阳 621900;;4.北京应用物理与计算数学研究所，北京 100088 |
| 基金项目： | 国家重点研发计划项目（2017YFA0403300） |
| 摘 要： |  高精密的X射线成像诊断是深入理解内爆过程，揭示点火尺度下未知物理问题的关键。基于掠入射反射的X射线显微镜，结合亚纳米级的超光滑球面或非球面反射镜，能够实现空间分辨优于5 μm的高分辨成像。介绍了国际惯性约束聚变领域的X射线显微成像技术发展及应用，重点展示了我国在高分辨X射线（KB）显微镜、多通道X射线KB显微镜以及大视场X射线KBA显微镜方向的进展，分析了下一阶段超高分辨X射线显微成像的研究计划。通过不断的技术创新，我国的X射线显微成像诊断能力已经达到国际先进水平。 |
| 关 键 词： | 惯性约束聚变 等离子体诊断 X射线光学 KB显微镜 Wolter显微镜 |
| 收稿时间： | 2020-05-19 |
| 修稿时间： | 2020-07-01 |
Progress of grazing incidence X-ray micro-imaging diagnosis technology |
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| Xu Jie, Mu Baozhong, Chen Liang, et al. Progress of grazing incidence X-ray micro-imaging diagnosis technology[J]. High Power Laser and Particle Beams, 2020, 32: 112001. doi: 10.11884/HPLPB202032.200133 | |
| Authors: | Xu Jie Mu Baozhong Chen Liang Li Wenjie Xu Xinye Wang Xin Wang Zhanshan Zhang Xing Ding Yongkun |
| Affiliation: | 1. Key Laboratory of Advanced Micro-structured Materials, Ministry of Education, Tongji University, Shanghai 200092, China;;2. School of Physics Science and Engineering, Tongji University, Shanghai 200092, China;;3. Laser Fusion Research Center, CAEP, Mianyang 621900, China;;4. Institute of Applied Physics and Computational Mathematics, Beijing 100088, China |
| Abstract: | High-precision X-ray imaging diagnosis is the key to understanding the implosion process and revealing unknown physical problems at the ignition scale. X-ray microscope based on grazing incidence reflection, combined with sub-nanometer ultra-smooth spherical or aspherical mirror, can achieve high-resolution imaging with spatial resolution better than 5 μm. This paper introduces the development and application of foreign X-ray microscopic imaging technology in the field of ICF research, highlights the progress of China’s high-resolution X-ray Kirkpatrick-Baez (KB) microscope, multi-channel X-ray KB microscope and large-field X-ray KBA microscope. The research plan for the next stage of ultra-high resolution X-ray microscopic imaging is analyzed. Through continuous technological innovation, China's X-ray microscopic imaging diagnostic capabilities have reached the internationally advanced level. |
| Keywords: | inertial confinement fusion plasma diagnosis X-ray optics Kirkpatrick-Baez microscope Wolter microscope |
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