Analysis of second-harmonic generation microscopy under refractive index mismatch |
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| Authors: | Wang Xiang-Hui Lin Lie and Zhang Yang |
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| Affiliation: | The Key Laboratory of Opto-electronic Information Science and Technology, the Ministry of Education, Tianjin 300071, China; Institute of Modern Optics, Nankai University, Tianjin 300071, China; |
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| Abstract: | On the basis of the vector diffraction theory and Green’s function method, this paper investigates the effectsof refractive index mismatch on second-harmonic generation (SHG) microscopy. The polarization distribution andSHG intensity are calculated as functions of the sample radius and probe depth. The numerical results show thatrefractive index mismatch can result in peak intensity degradation, increase secondary lobes and extension of secondharmonicpolarization distribution. Because of the attenuation of polarization intensity, the detected SHG intensitysignificantly decreases with increasing probe depth, which can limit the imaging depth of SHG microscopy inside thicksamples. Forward SHG intensity decays slowly than backward SHG, due to the combination of extension secondharmonicpolarization distribution and strong dependency of forward SHG on sample radius. |
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| Keywords: | microscopy second-harmonic generation polarization refractive index mismatch |
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