| MCNP程序中一处缺陷的证实及规避方法北大核心CSCD |
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| 引用本文： | 吕焕文,唐松乾.MCNP程序中一处缺陷的证实及规避方法北大核心CSCD[J].强激光与粒子束,2016,28(9):096003-167. |
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| 作者姓名： | 吕焕文 唐松乾 |
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| 作者单位： | 1.中国核动力研究设计院 核反应堆系统设计技术重点实验室,成都 61 021 3 |
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| 摘 要： | 当应用MCNP程序的SDEF卡进行固定源问题的源信息描述时,需要对源的分布进行描述,MCNP程序提供了SP卡用以指定源在各个栅元中的分布概率,SP卡中的V选项用于便利用户实现体密度方式的源强分布描述。研究发现,该程序存在一个缺陷,在使用SP卡V选项时可能会导致计算结果的不准确。通过构建典型算例模型,对使用V选项和不使用该选项的计算结果进行对比分析,可以证实该缺陷的存在,并且能够证明可以通过其他源描述方法在具体的程序使用中规避该缺陷。
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| 关 键 词： | 辐射屏蔽 MCNP程序 源分布 缺陷 SP卡 V选项 |
| 收稿时间： | 2015-12-02 |
Verification of a bug in MCNP code and relative solutions |
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| Affiliation: | 1.Science and Technology on Reactor System Design Technology Laboratory,Nuclear Power Institute of China,Chengdu 610213,China |
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| Abstract: | When using SDEF card in MCNP code to describe source information of fixed sources, it is necessary to input the distribution of the source. MCNP code offers SP card to input the distribution probability. The V option of SP card is for cell distributions only. Recent research discovers that there is a bug when using this option, which may lead to wrong calculation results. Making up a typical model, a comparison between the results using V option and not using V option was made. The comparison shows that the bug really exists. The effectiveness of the solutions proposed was also validated. |
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