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人工晶体学报 ›› 2017, Vol. 46 ›› Issue (4): 594-598.

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基于原子层沉积的氧化锆薄膜工艺优化研究

张禹;韦习成;张浩   

  1. 上海大学材料科学与工程学院,上海 200072;福建江夏学院电子信息科学学院,福州 350108;有机光电子福建省高校工程研究中心,福州 350108;上海大学材料科学与工程学院,上海,200072;福建江夏学院电子信息科学学院,福州 350108;有机光电子福建省高校工程研究中心,福州 350108
  • 出版日期:2017-04-15 发布日期:2021-01-20
  • 基金资助:
    国家自然科学基金(51402050);福建省自然科学基金(2017J01733,2015J01654)

Study on Process Optimization of Zirconia Thin Films Based on Atomic Layer Deposition

  • Online:2017-04-15 Published:2021-01-20

摘要: 利用原子层沉积技术(Atomic layer deposition, ALD)进行ZrO2薄膜工艺研究,获得了低温下ZrO2薄膜ALD的最佳工艺条件.分析了在低温下前驱体脉冲时间,吹扫时间生长工艺条件对薄膜性能的影响.以四(二甲基氨)基锆(TDMAZ)和H2O为前驱体,制备了均匀性良好,表面粗糙度低,可见光透过率高,水汽阻挡效果良好的ZrO2薄膜.

关键词: 原子层沉积;ZrO2薄膜;工艺优化

Abstract: Study on process of ZrO2 thin films was carried out by atomic layer deposition(ALD)and the best process condition of ZrO2 thin films ALD was achieved.The effects of pulse and purge time of precursor on the properties of the deposited ZrO2 thin films under low temperature were analysed.The ZrO2 thin films with good uniformity, low surface roughness and high visible light transmittance were prepared by using Tetrakis (dimethylamido) zirconium (TDMAZ) and H2O as precursors.

Key words: Study on process of ZrO2 thin films was carried out by atomic layer deposition(ALD)and the best process condition of ZrO2 thin films ALD was achieved.The effects of pulse and purge time of precursor on the properties of the deposited ZrO2 thin films under low temperature were analysed.The ZrO2 thin films with good uniformity, low surface roughness and high visible light transmittance were prepared by using Tetrakis (dimethylamido) zirconium (TDMAZ) and H2O as precursors.

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