不同微场分布函数下的光谱线型

doi:10.3964/j.issn.1000-0593(2010)03-0582-04

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摘要：根据光谱学，总的光谱线型是各种加宽机制的卷积结果。考虑到等离子体中的离子碰撞，Stark加宽本质上是一种非对称的光谱线型, 其中微场分布函数对光谱线型起着非常关键的作用。该文利用不同的微场分布函数研究了微场分布函数对总的光谱线型的影响。研究结果表明，在电子加宽参数和离子加宽参数很小时，不同微场分布函数对整个光谱线型的影响基本相似，但随着离子加宽参数的增加，3种不同的微场分布函数对Stark光谱线型的影响逐渐增加; 随着电子加宽参数的增加，不同的微场分布函数对Stark光谱线型的影响也逐渐增加; 但总体上Holtsmark分布和Nearest-Neighbor场分布下的光谱线型差别较小，但是Mayer模型对光谱线型影响较大。特别是，当离子加宽参数较大时，Mayer模型对光谱线型的影响异常明显，这也正说明离子间碰撞剧烈时对光谱线型的影响很大。该结果对等离子体参数诊断有一定参考价值。

关键词：光谱学;Stark加宽;微场分布函数;光谱诊断

Abstract：According to Stark broadening theory, Stark broadening spectral line profile is asymmetric in essence considering plasma ions impact. The electric microfield distribution function is very important for the spectral line profile. The Stark broadening spectral line profile is described with different electric microfield distribution functions. The results show that the Stark broadening spectral line profile is similar with the Holtsmark distribution and nearest-neighbor field distribution, and it is diversification with Mayer model. With the decrease in the electrons impact broadening parameter, the influence of different electric microfield distribution functions is diminished. With the decrease in the plasma ions impact parameter, the influence of different electric microfield distribution functions is trailing off. The results also show that the action of electric microfield distribution functions is similar when the plasma ions impact parameter is very small. It is illustrated that the intense impact of plasma ions has great influence on the spectral line profile. The results may have important reference for the plasma diagnosis.

Key words：Spectroscopy;Stark broadening;Microfield distribution function;Spectral diagnosis

收稿日期: 2009-03-28 修订日期: 2009-06-29

中图分类号:

O53

通讯作者: 冉俊霞 E-mail: rjxhbu@hbu.cn

引用本文:

冉俊霞¹，张少朋²，马东³，王晓菲¹ . 不同微场分布函数下的光谱线型[J]. 光谱学与光谱分析, 2010, 30(03): 582-585.
RAN Jun-xia¹，ZHANG Shao-peng²，MA Dong³，WANG Xiao-fei¹ . The Spectral Line Profile with Different Electric Microfield Distribution Functions. SPECTROSCOPY AND SPECTRAL ANALYSIS, 2010, 30(03): 582-585.

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